SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces
Chaikina, Elena I., Negrete-Regagnon, Pedro, Martinez-Niconoff, Gabriel C., Mendez, Eugenio R., Gu, Zu-Han, Maradudin, Alexei A.Volume:
3426
Year:
1998
Language:
english
DOI:
10.1117/12.328449
File:
PDF, 692 KB
english, 1998