SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Approach for the evaluation of indirect measurement uncertainty based on neural networks
Zhu, Jianmin, Zhang, Guangjun, Zhao, Huijie, Wang, Zhongyu, Xia, Xintao, Wang, Zhongyu, Li, PingVolume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521825
File:
PDF, 122 KB
english, 2003