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SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Environmental testing of COTS components for space applications
Ramesham, Rajeshuni, Kullberg, Richard C., Ramesham, RajeshuniVolume:
7206
Year:
2009
Language:
english
DOI:
10.1117/12.813408
File:
PDF, 1.87 MB
english, 2009