SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase shift based measurements using a pocket LCD projector
Williams, Yana, Harding, Kevin, Huang, Peisen S., Harding, Kevin, Yoshizawa, ToruVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.871214
File:
PDF, 2.09 MB
english, 2010