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SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Optical Methods for Chemical Process Control - Applications of FTNIR spectroscopy to process monitoring
Peters, David C., Shearer, James C., Farquharson, Stuart, Lerner, Jeremy M.Volume:
2069
Year:
1993
Language:
english
DOI:
10.1117/12.166293
File:
PDF, 619 KB
english, 1993