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SPIE Proceedings [SPIE Laser Dimensional Metrology: Recent Advances for Industrial Application - Brighton, United Kingdom (Tuesday 5 October 1993)] Laser Dimensional Metrology: Recent Advances for Industrial Application - Two- and three-dimensional laser scanners for fast dimensional measurements and inspection
van Amstel, Willem D., Asjes, Ronald J., van de Goor, Peter F., Merkelbach, Piet, Downs, Michael J.Volume:
2088
Year:
1993
Language:
english
DOI:
10.1117/12.168057
File:
PDF, 381 KB
english, 1993