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SPIE Proceedings [SPIE Optical 3D Measurement Techniques II: Applications in Inspection, Quality Control, and Robotics - Zurich, Switzerland (Monday 4 October 1993)] Optical 3D Measurement Techniques II: Applications in Inspection, Quality Control, and Robotics - Separable approximation methods for orientational filters and VLSI implementations
Kubota, Toshiro, Alford, C. O., Woods, M. B., Gruen, Armin, Kahmen, HeribertVolume:
2252
Year:
1994
Language:
english
DOI:
10.1117/12.169836
File:
PDF, 353 KB
english, 1994