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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Vision Systems: Sensors, Sensor Systems, and Components - Log polar image sensor in CMOS technology
Scheffer, Danny, Dierickx, Bart, Pardo, Fernando, Vlummens, Jan, Meynants, Guy, Hermans, Lou, Loffeld, OtmarVolume:
2784
Year:
1996
Language:
english
DOI:
10.1117/12.248520
File:
PDF, 576 KB
english, 1996