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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Surface rugosity and polarimetric analysis

Elies, Philippe, Le Jeune, Bernard, Marie, Jean-Pierre, Cariou, Jack, Lotrian, Jean, Gorecki, Christophe
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Volume:
2782
Year:
1996
Language:
english
DOI:
10.1117/12.250804
File:
PDF, 1.08 MB
english, 1996
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