![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] GOES-8 and Beyond - Impact of the visible detector design on GOES imager and sounder MTF
Williams, Frederick L., Wickholm, David R., Ehlert, John C., Washwell, Edward R.Volume:
2812
Year:
1996
Language:
english
DOI:
10.1117/12.254101
File:
PDF, 1.10 MB
english, 1996