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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Optics for High-Brightness Synchrotron Radiation Beamlines II - Significant improvements in Long Trace Profiler measurement performance
Takacs, Peter Z., Bresloff, Cynthia J., Berman, Lonny E., Arthur, JohnVolume:
2856
Year:
1996
Language:
english
DOI:
10.1117/12.259878
File:
PDF, 386 KB
english, 1996