SPIE Proceedings [SPIE Third International Conference on Thin Film Physics and Applications - Shanghai, China (Tuesday 15 April 1997)] Third International Conference on Thin Film Physics and Applications - Evaluation of diamond-coated tool adhesion by indentation test
Zhang, Zhiming, Shen, Hesheng, He, Xianchang, Li, Shenghua, Zhou, Shixun, Wang, Yongling, Chen, Yi-Xin, Mao, ShuzhengVolume:
3175
Year:
1998
DOI:
10.1117/12.300644
File:
PDF, 508 KB
1998