SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Photoluminescent investigations of SHF irradiation effect on defect states in GaAs:Sn(Te) and InP crystals

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