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SPIE Proceedings [SPIE 1998 International Conference on Applications of Photonic Technology - Ottawa, Canada (Monday 27 July 1998)] 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications - Toroidal surface profilometries through Ronchi deflectrometry: constancy under rotation of the sample
Arasa, Josep, Royo, Santiago, Pizarro, Carlos, Lampropoulos, George A., Lessard, Roger A.Volume:
3491
Year:
1998
Language:
english
DOI:
10.1117/12.328653
File:
PDF, 781 KB
english, 1998