SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Polarization: Measurement, Analysis, and Remote Sensing II - General Lorentz transformation and its application to deriving and evaluating the Mueller matrices of polarization optics
Brown, Charles S., Bak, Aakhut E., Goldstein, Dennis H., Chenault, David B.Volume:
3754
Year:
1999
Language:
english
DOI:
10.1117/12.366361
File:
PDF, 430 KB
english, 1999