![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Symposium on Applied Photonics - Glasgow, United Kingdom (Sunday 21 May 2000)] Optical Diagnostics for Industrial Applications - Fundamental limitations to the spatial resolution and flow volume that can be mapped using holographic particle image velocimetry
Coupland, Jeremy M., Lobera Salazar, Julia, Halliwell, Neil A., Halliwell, Neil A.Volume:
4076
Year:
2000
Language:
english
DOI:
10.1117/12.397966
File:
PDF, 1.39 MB
english, 2000