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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Instruments for Optics and Optoelectronic Inspection and Control - Software solutions to quality enhancement of moire fringes in displacement measuring
Su, Shaojing, Huang, Zhiping, Lu, Haibao, Zhang, Yimeng, Wei, Guang Hui, Liu, ShengVolume:
4223
Year:
2000
Language:
english
DOI:
10.1117/12.401796
File:
PDF, 147 KB
english, 2000