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SPIE Proceedings [SPIE International Topical Symposium on Advanced Optical Manufacturing and Testing Technology - Chengdu, China (Wednesday 1 November 2000)] Advanced Optical Manufacturing and Testing Technology 2000 - Superlong-radius measurement
Yu, Jingchi, Sun, Xiafei, Guo, Peiji, Yang, Li, Pollicove, Harvey M., Xin, Qiming, Wyant, James C.Volume:
4231
Year:
2000
Language:
english
DOI:
10.1117/12.402817
File:
PDF, 130 KB
english, 2000