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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Advances in Neutron Scattering Instrumentation - A look ahead in residual stress analysis: the strain imager at the ILL
Bruno, Giovanni, Pirling, Thilo, Rowe, S., Hutt, W., Withers, P. J., Carlile, Colin J., Anderson, Ian S., Gurard, BrunoVolume:
4785
Year:
2002
Language:
english
DOI:
10.1117/12.453929
File:
PDF, 599 KB
english, 2002