SPIE Proceedings [SPIE SPIE's 27th Annual International...

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SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Advances in Resist Technology and Processing XIX - Development of bottom antireflective coating for high-resolution KrF lithography

Kang, Yoon-Ho, Oh, Chang-Il, Song, Sung K., Kim, Deog-Bae, Kim, Jae-Hyun, Fedynyshyn, Theodore H.
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Volume:
4690
Year:
2002
Language:
english
DOI:
10.1117/12.474185
File:
PDF, 952 KB
english, 2002
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