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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Ultraviolet Ground- and Space-based Measurements, Models, and Effects IV - Measuring aerosol UV absorption optical thickness by combining use of shadowband and almucantar techniques
Krotkov, Nickolay A., Slusser, James R., Herman, Jay R., Bhartia, Pawan K., Herman, Jay R., Gao, Wei, Bernhard, Germar, Slusser, James, Scott, Gwen, Labow, Gordon, Vasilkov, Alexander P., Eck, Thomas,Volume:
5545
Year:
2004
Language:
english
DOI:
10.1117/12.559557
File:
PDF, 539 KB
english, 2004