SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Sensors, Cameras, and Systems for Scientific/Industrial Applications VII - A new direct detection camera system for electron microscopy
Li, Shengdong, Blouke, Morley M., Bouwer, James, Duttweiler, Fred, Ellisman, Mark, Jin, Liang, Leblanc, Phillip, Milazzo, Anna, Peltier, Steve, Xuong, Nguyen, Kleinfelder, StuartVolume:
6068
Year:
2006
Language:
english
DOI:
10.1117/12.650673
File:
PDF, 2.73 MB
english, 2006