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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Optical Components and Materials V - Spectroscopic studies and AFM analysis of Er 3+ -doped yttrium oxide nanoparticles
Patel, Darayas, Digonnet, Michel J. F., Jiang, Shibin, Glesener, John W., Dries, J. ChristopherVolume:
6890
Year:
2008
Language:
english
DOI:
10.1117/12.783870
File:
PDF, 330 KB
english, 2008