SPIE Proceedings [SPIE 1988 Orlando Technical Symposium -...

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SPIE Proceedings [SPIE 1988 Orlando Technical Symposium - Orlando, FL (Monday 4 April 1988)] Automated Testing of Electro-Optical Systems - Calculation Of Apparent Delta-T Errors For Band-Limited Detectors

Gallinger, Dave A., Mei, Eden Y. C., Blanchet, Edward C., McHugh, Stephen W., Nestler, John, Richardson, Philip I.
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Volume:
941
Year:
1988
Language:
english
DOI:
10.1117/12.947176
File:
PDF, 283 KB
english, 1988
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