Peculiarities of the electronic structure and phase composition of amorphous (SiO2)x(a-Si: H)x–1composite films according to X-ray spectroscopy data
Terekhov, V. A., Parinova, E. V., Domashevskaya, E. P., Sadchikov, A. S., Terukov, E. I., Undalov, Yu. K., Sen’kovskii, B. V., Turishchev, S. Yu.Volume:
41
Language:
english
Journal:
Technical Physics Letters
DOI:
10.1134/S1063785015100296
Date:
October, 2015
File:
PDF, 308 KB
english, 2015