Excess carrier lifetime measurements in indium antimonide...

Journal of Materials Science: Materials in Electronics 1993 / 09 Vol. 4; Iss. 3

Excess carrier lifetime measurements in indium antimonide using a contactless laser technique

A. B. Fedortsov, D. G. Letenko, Yu. V. Churkin, V. N. Savvate'ev
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Volume:
4
Language:
english
Pages:
5
DOI:
10.1007/bf00224742
Date:
September, 1993
File:
PDF, 445 KB
english, 1993
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