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2.2.1 Test time reduction by optimal test sequencing1
Boumen, R., de Jong, I.S.M., van de Mortel-Fronczak, J.M., Rooda, J.E.Volume:
16
Language:
english
Journal:
INCOSE International Symposium
DOI:
10.1002/j.2334-5837.2006.tb02741.x
Date:
July, 2006
File:
PDF, 667 KB
english, 2006