ToF-SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams
Shon, Hyun Kyong, Cho, Young-Lai, Lim, Choung Su, Choi, Joon Sig, Chung, Sang J., Lee, Tae GeolVolume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5514
Date:
November, 2014
File:
PDF, 740 KB
english, 2014