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SPIE Proceedings [SPIE Semi - DL tentative - San Diego, CA (Thursday 1 March 1990)] Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors - Electron-waveguide transmission resonance at a defect
Kriman, Alfred M., Haukness, B. S., Ferry, David K., Craighead, Harold G., Gibson, J. M.Volume:
1284
Year:
1990
Language:
english
DOI:
10.1117/12.20777
File:
PDF, 547 KB
english, 1990