SPIE Proceedings [SPIE International Conference on Intelligent Manufacturing - Wuhan, China (Saturday 10 June 1995)] International Conference on Intelligent Manufacturing - Automatic planning for probe measurement
Huang, Tongjun, Duan, Guanhong, Zhou, Ji, Thompson, William, Yang, Shuzi, Zhou, Ji, Li, Cheng-GangVolume:
2620
Year:
1995
Language:
english
DOI:
10.1117/12.217485
File:
PDF, 155 KB
english, 1995