SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design - Combining finite element analysis with digital light-in-flight recording by holography
Nilsson, Bengt J., Carlsson, Torgny E., Osten, Wolfgang, Jueptner, Werner P. O., Kujawinska, MalgorzataVolume:
4398
Year:
2001
Language:
english
DOI:
10.1117/12.445569
File:
PDF, 3.07 MB
english, 2001