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SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Infrared Materials, Devices, and Applications - Surface defects induced by impurities in MBE-grown HgCdTe
Fu, Xiangliang, Cai, Yi, Gong, Haimei, Wang, Weiqiang, Wei, Qingzhu, Chatard, Jean-Pierre, Wu, Jun, Chen, Lu, Wu, Yan, He, LiVolume:
6835
Year:
2007
Language:
english
DOI:
10.1117/12.757156
File:
PDF, 1.04 MB
english, 2007