Simulation of near-tip crack behaviour and its correlation to fatigue crack growth with a modified strip-yield model
Wang, Lei, Chen, Yongkang, Tiu, William, Xu, YigengVolume:
5
Year:
2008
Language:
english
Journal:
International Journal of Modelling, Identification and Control
DOI:
10.1504/ijmic.2008.021777
File:
PDF, 277 KB
english, 2008