SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Recognition of characteristic symbols in engineering drawings
Lai, Chan P., Kasturi, Rangachar, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.Volume:
1661
Year:
1992
Language:
english
DOI:
10.1117/12.130276
File:
PDF, 220 KB
english, 1992