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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - System integration of road-crack evaluation system
Abe, Satoshi, Abe, Toshio, Sato, Hisao, Okano, Taizo, Sengoku, Koki, Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
Language:
english
DOI:
10.1117/12.144821
File:
PDF, 881 KB
english, 1993