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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] X-Ray and Ultraviolet Polarimetry - Application of a charge-coupled device as an x-ray polarimeter
Tsunemi, Hiroshi, Hayashida, Kiyoshi, Tamura, Keisuke, Nomoto, Susumu, Wada, Mikio, Miyata, Emi, Miura, Noriuki, Fineschi, SilvanoVolume:
2010
Year:
1994
Language:
english
DOI:
10.1117/12.168581
File:
PDF, 976 KB
english, 1994