![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optics for Productivity in Manufacturing - Frankfurt, Federal Republic of Germany (Sunday 19 June 1994)] Optical Measurements and Sensors for the Process Industries - Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method
Bertolotti, Mario, Liakhou, G. L., Li Voti, Roberto, Wang, Ruo Peng, Sibilia, Concita, Yacovlev, Vladimir P., Gorecki, Christophe, Preater, Richard W. T.Volume:
2248
Year:
1994
Language:
english
DOI:
10.1117/12.194337
File:
PDF, 581 KB
english, 1994