SPIE Proceedings [SPIE Optical Sensing for Environmental and Process Monitoring - McLean, VA (Sunday 6 November 1994)] Optical Sensors for Environmental and Chemical Process Monitoring - In-situ measurement of residual carbon content in flyash
Bonanno, Anthony S., Knight, Kim S., Kinsella, Karen, Serio, Michael A., Solomon, Peter R., Aggarwal, Ishwar D., Farquharson, Stuart, Koglin, EricVolume:
2367
Year:
1995
Language:
english
DOI:
10.1117/12.199667
File:
PDF, 391 KB
english, 1995