SPIE Proceedings [SPIE 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014) - Harbin, China (Saturday 26 April 2014)] 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging - An improved method of edge detection based on the mean shift algorithm
Jiang, Yadong, Yu, Junsheng, Kippelen, Bernard, Wei, Laixing, Liu, Bo, Mou, JiaoVolume:
9284
Year:
2014
Language:
english
DOI:
10.1117/12.2069468
File:
PDF, 829 KB
english, 2014