SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII - X-ray transient monitor for JEM on the International Space Station
Kawai, Nobuyuki, Matsuoka, Masaru, Yoshida, Atsumasa, Tsunemi, Hiroshi, Siegmund, Oswald H. W., Gummin, Mark A.Volume:
2808
Year:
1996
Language:
english
DOI:
10.1117/12.256028
File:
PDF, 351 KB
english, 1996