SPIE Proceedings [SPIE Industrial Lasers and Inspection...

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SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Environmental Sensing and Applications - Laboratory measurements of scattering by algae and comparison with Mie scattering

Lotsberg, Jon K., Frette, Oyvind, Erga, Svein R., Stamnes, Jakob J., Carleer, Michel R., Hilton, Moira, Lamp, Torsten, Reuter, Rainer, Russwurm, George M., Schaefer, Klaus, Weber, Konradin, Weitkamp,
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Volume:
3821
Year:
1999
Language:
english
DOI:
10.1117/12.364188
File:
PDF, 993 KB
english, 1999
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