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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Instruments for Optics and Optoelectronic Inspection and Control - Improvement of tapping-mode scanning near-field optical microscope
Zhuo, Wenjiang, Li, Qin, Sun, Jialin, Xu, Jianhua, Zhao, Jun, Guo, Jihua, Wei, Guang Hui, Liu, ShengVolume:
4223
Year:
2000
Language:
english
DOI:
10.1117/12.401792
File:
PDF, 232 KB
english, 2000