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SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Process Control and Diagnostics - Nonlinear optical properties of SiC nanocrystallites
Plucinski, Kazimierz J., Kityk, Ivan V., Kassiba, Adi, Miller, Michael L., Ashtiani, Kaihan A.Volume:
4182
Year:
2000
Language:
english
DOI:
10.1117/12.410088
File:
PDF, 771 KB
english, 2000