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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Machine Vision Applications in Industrial Inspection X - Characterization of 3D dynamic textures with estimation of their movements
Brochard, Jacques, Khoudeir, Majdi, Hunt, Martin A.Volume:
4664
Year:
2002
Language:
english
DOI:
10.1117/12.460201
File:
PDF, 643 KB
english, 2002