SPIE Proceedings [SPIE High-Power Lasers and Applications - San Jose, CA (Saturday 25 January 2003)] Gas and Chemical Lasers and Intense Beam Applications IV - Diode laser-based diagnostic for NCl(X)
Davis, Steven J., Mulhall, Phillip A., Kessler, William J., Heaven, Michael C., Manke II, Gerald C., Davis, Steven J., Heaven, Michael C.Volume:
4971
Year:
2003
Language:
english
DOI:
10.1117/12.483500
File:
PDF, 168 KB
english, 2003