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SPIE Proceedings [SPIE Photonics, Devices, and Systems II - Prague, Czech Republic (Sunday 26 May 2002)] Photonics, Devices, and Systems II - Automatic stand for metrological certification of high-accuracy angular measuring devices
Parvulyusov, Yuri B., Ilyuhin, Valery A., Yakushenkov, Yuri G., Hrabovsky, Miroslav, Senderakova, Dagmar, Tomanek, PavelVolume:
5036
Year:
2003
Language:
english
DOI:
10.1117/12.498329
File:
PDF, 96 KB
english, 2003