SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Imaging Spectrometry IX - Analysis of noise in passive Fourier transform infrared measurements of some representative backgrounds as a function of meteorological conditions
Shen, Sylvia S., Samuels, Alan C., Flanigan, Dennis, Lewis, Paul E., Ben-David, AvishaiVolume:
5159
Year:
2003
Language:
english
DOI:
10.1117/12.506499
File:
PDF, 392 KB
english, 2003