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SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - Nanoscale nondestructive electric field probing in ferroelectrics, organic molecular films and near-field optical nanodevices
Eng, Lukas M., Meyendorf, Norbert, Baaklini, George Y., Grafstrom, Stefan, Hellmann, Ingo, Michel, Bernd, Loppacher, Christian, Otto, Tobias, Renger, Jan, Schlaphof, Frank, Seidel, Jan, Zerweck, UlricVolume:
5392
Year:
2004
Language:
english
DOI:
10.1117/12.544503
File:
PDF, 847 KB
english, 2004