SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control - Vector scattering analysis of TPF coronagraph pupil masks
Ceperley, Daniel P., Chen, Philip T. C., Fleming, John C., Neureuther, Andrew R., Lieber, Michael D., Dittman, Michael G., Kasdin, N. Jeremy, Shih, Ta-MingVolume:
5526
Year:
2004
Language:
english
DOI:
10.1117/12.562265
File:
PDF, 1.19 MB
english, 2004