SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Zeeman laser for straightness measurements
Rzepka, Janusz, Osten, Wolfgang, Gorecki, Christophe, Budzyn, Grzegorz, Fraczek, Wojciech, Novak, Erik L., Bielenin, MarcinVolume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612658
File:
PDF, 390 KB
english, 2005